Iterative built-in testing and tuning of mixed-signal/RF systems

Author

Chatterjee, A. ; Han, D. ; Natarajan, V. ; Devarakond, S. ; Sen, S. ; Choi, H. ; Senguttuvan, R. ; Bhattacharya, S. ; Goyal, A. ; Lee, D. ; Swaminathan, M.

Author_Institution

Sch. of Electr. Eng., Georgia Inst. of Technol., Atlanta, GA, USA

fYear

2009

fDate

4-7 Oct. 2009

Firstpage

319

Lastpage

326

Abstract

Design and test of high-speed mixed-signal/RF circuits and systems is undergoing a transformation due to the effects of process variations stemming from the use of scaled CMOS technologies that result in significant yield loss. To this effect, post-manufacture tuning for yield recovery is now a necessity for many high-speed electronic circuits and systems and is typically driven by iterative test-and-tune procedures. Such procedures create new challenges for manufacturing test and built-in self-test of advanced mixed-signal/RF systems. In this paper, key test challenges are discussed and promising solutions are presented in the hope that it will be possible to design, manufacture and test Â¿truly self-healingÂ¿ systems in the near future.

Keywords

CMOS integrated circuits; built-in self test; integrated circuit design; integrated circuit testing; mixed analogue-digital integrated circuits; radiofrequency integrated circuits; high-speed electronic circuits; high-speed mixed-signal-RF circuits; iterative built-in testing; iterative test-and-tune procedures; post-manufacture tuning; scaled CMOS technologies; truly self-healing systems; Automatic testing; CMOS process; CMOS technology; Circuit optimization; Circuit testing; Circuits and systems; Electronic equipment testing; High-speed electronics; Radio frequency; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Computer Design, 2009. ICCD 2009. IEEE International Conference on

Conference_Location

Lake Tahoe, CA

ISSN

1063-6404

Print_ISBN

978-1-4244-5029-9

Electronic_ISBN

1063-6404

Type

conf

DOI

10.1109/ICCD.2009.5413136

Filename

5413136