DocumentCode :
3469028
Title :
Fast electrons downstream of a plane grid cathode in a nanosecond discharge in atmospheric pressure air
Author :
Tarasenko, Victor F. ; Kostyrya, Igor D. ; Rybka, Dmitri V. ; Kozyrev, Artem V. ; Baksht, Evgenii Kh
Author_Institution :
Inst. of High Current Electron., Tomsk, Russia
fYear :
2013
fDate :
16-21 June 2013
Firstpage :
1
Lastpage :
6
Abstract :
In this work, an experiment to examine the conditions under which a runaway electron beam moves not only toward the anode but also backward (to the space downstream of the cathode) was performed. For recording a backward runaway electron beam, a positive voltage pulse was applied to the high-voltage electrode of the gas diode. The breakdown of atmospheric pressure air gaps with a special cathode design at a rate of voltage rise of 1014 V/s was studied with subnanosecond and picosecond time resolution. In the space downstream of the cathode, which was made of thin wires arranged parallel to a thin flat foil, a runaway electron beam (fast electrons) was detected. The current of the fast electron beam downstream of the cathode depended strongly on the anode material. With the Ta anode, the number of electrons in the backward beam increased 4 times compared to that with the Al anode. Measurements of the X-ray exposure dose downstream of the cathode show that for the Ta anode, it was also 4 times higher.
Keywords :
air gaps; anodes; atmospheric pressure; cathodes; electron beams; Al; Ta; X-ray exposure dose downstream; anode material; atmospheric pressure air gaps; backward runaway electron beam; fast electron beam downstream; gas diode; high-voltage electrode; nanosecond discharge; picosecond time resolution; plane grid cathode; positive voltage pulse; space downstream; special cathode design; subnanosecond time resolution; thin flat foil; thin wires; Aluminum; Anodes; Cathodes; Discharges (electric); Electric fields; Electron beams; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pulsed Power Conference (PPC), 2013 19th IEEE
Conference_Location :
San Francisco, CA
ISSN :
2158-4915
Type :
conf
DOI :
10.1109/PPC.2013.6627597
Filename :
6627597
Link To Document :
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