• DocumentCode
    3469417
  • Title

    Transaction-based debugging of system-on-chips with patterns

  • Author

    Gharehbaghi, Amir Masoud ; Fujita, Masahiro

  • Author_Institution
    VLSI Design & Educ. Center, Univ. of Tokyo, Tokyo, Japan
  • fYear
    2009
  • fDate
    4-7 Oct. 2009
  • Firstpage
    186
  • Lastpage
    192
  • Abstract
    This paper presents a debug method for system communications in post-silicon verification. First, we extract transaction sequences at run-time using on-chip circuits and store them in a trace buffer. Then, we read the stored transactions and analyze them with software. The analysis software tries to find certain patterns in the extracted transactions that are defined by our transaction debug pattern specification language (TDPSL). We have also defined a number of standard patterns for common communication problems such as race and deadlock in TDPSL. To show the feasibility of the method, it is applied to a number of on chip buses. It is shown that the area overhead of the method is very low. Also we have implemented the analysis software and shown that it is memory efficient, scalable and effective to find bugs. The proposed method can also be applied to fault analysis including transient faults.
  • Keywords
    network-on-chip; program debugging; specification languages; deadlock; on-chip buses; on-chip circuits; post-silicon verification; race; software analysis; system communications; system-on-chips; trace buffer; transaction debug pattern specification language; transaction sequence extraction; transient fault analysis; Buffer storage; Circuit faults; Communication standards; Pattern analysis; Runtime; Software debugging; Specification languages; System recovery; System-on-a-chip; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design, 2009. ICCD 2009. IEEE International Conference on
  • Conference_Location
    Lake Tahoe, CA
  • ISSN
    1063-6404
  • Print_ISBN
    978-1-4244-5029-9
  • Electronic_ISBN
    1063-6404
  • Type

    conf

  • DOI
    10.1109/ICCD.2009.5413157
  • Filename
    5413157