• DocumentCode
    3469516
  • Title

    Switching characteristic of Si-IEGTs and SiC-PiN diodes pair connected in series

  • Author

    Sung, Kyungmin ; Akiyama, Hironobu ; Takao, Kazuto ; Kanai, Takeo ; Tanaka, Yasunori ; Ohashi, Hiromichi

  • Author_Institution
    Ibaraki Nat. Coll. of Technol., Hitachinaka, Japan
  • fYear
    2010
  • fDate
    21-24 June 2010
  • Firstpage
    150
  • Lastpage
    175
  • Abstract
    In this paper, in order to realize high voltage static switches of voltage source inverters in high power applications, two series connected 4.5kV rate Si-IEGT with SiC-PiN diode pairs (hybrid combination) are considered with hard switching method. The switching test of power module that is hybrid combination is carried out under 5kV DC bias voltage. The gate driver circuit is designed by high output power capacity for high speed hard switching. Small reverse recovery charge of SiC-PiN diode and the hard switching method are adopted for the purpose of not only high switching frequency but also high power density in the high power converter system. Experimental results show good switching characteristic of voltage balancing with small size capacitor and balance resistors at the switching period.
  • Keywords
    elemental semiconductors; field effect transistors; invertors; p-i-n diodes; power semiconductor switches; silicon; silicon compounds; wide band gap semiconductors; IEGT; PIN diodes; Si; SiC; balance resistors; hard switching method; high voltage static switch; injection enhanced gate transistor; switching characteristic; switching test; voltage 4.5 kV; voltage 5 kV; voltage source inverter; Circuit testing; Diodes; Driver circuits; Inverters; Multichip modules; Power generation; Switches; Switching circuits; Switching frequency; Voltage; Series connection; Si-IEGT; SiC-PiN diode; high power and voltage application;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics Conference (IPEC), 2010 International
  • Conference_Location
    Sapporo
  • Print_ISBN
    978-1-4244-5394-8
  • Type

    conf

  • DOI
    10.1109/IPEC.2010.5543850
  • Filename
    5543850