Title :
An optical streak diagnostic for observing anode-cathode plasmas for radiographic source development
Author :
Droemer, Darryl W. ; Crain, Marlon D. ; Lare, Gregory A. ; Bennett, Nichelle ; Johnston, Mark D.
Author_Institution :
Nat. Security Technol., LLC, Las Vegas, NV, USA
Abstract :
National Security Technologies and Sandia National Laboratories are collaborating in the research and development of pulsed-power-driven intense electron beam sources for x-ray radiography. These diode sources typically generate electrode plasmas with densities of 1013-1017 cm-3, and understanding these plasmas is critical for optimizing the radiographic performance. NSTec has developed and fielded two systems which provide temporally and spatially resolved measurements of plasma density distributions. Details of the hardware are provided along with example measurement results.
Keywords :
plasma X-ray sources; plasma density; plasma diagnostics; plasma diodes; plasma sources; radiography; NSTec; National Security Technologies; Sandia National Laboratories; anode-cathode plasmas; diode sources; electrode plasmas; optical streak diagnostic; plasma density distributions; pulsed-power-driven intense electron beam sources; radiographic source development; spatially resolved measurement; temporally resolved measurement; x-ray radiography; Anodes; Cameras; Cathodes; Optical imaging; Plasmas; Spatial resolution;
Conference_Titel :
Pulsed Power Conference (PPC), 2013 19th IEEE
Conference_Location :
San Francisco, CA
DOI :
10.1109/PPC.2013.6627628