An in situ technique for the resolution of aging contributions between quartz resonators and oscillator circuits

The in situ technique has been validated with theory and demonstrated by experiment. This powerful technique may now be used to investigate both component and parametric behavior in quartz oscillators. Such issues as drive level dependency and short term frequency “pops” may be better understood through the technique. Aging models, particularly those involved with prediction, will benefit from the separation of crystal resonator from circuitry