DocumentCode :
3469889
Title :
IEC dependability standards in the new millennium panel
Author :
Moss, Jim ; Loll, V.
fYear :
2000
fDate :
2000
Firstpage :
169
Lastpage :
174
Keywords :
Assembly; Availability; Business; IEC standards; Maintenance; Standardization; Standards publication; Technical Activities Guide -TAG; Tellurium; Terminology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 2000. Proceedings. Annual
ISSN :
0149-144X
Print_ISBN :
0-7803-5848-1
Type :
conf
DOI :
10.1109/RAMS.2000.816302
Filename :
816302
Link To Document :
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