DocumentCode :
3469919
Title :
Improvements in reliability assessment and prediction methodology
Author :
Johnson, Bruce G. ; Gullo, Lou
Author_Institution :
Dept. of Commercial Aviation Syst.-Sensor Products Operations, Honeywell Inc., Minneapolis, MN, USA
fYear :
2000
fDate :
2000
Firstpage :
181
Lastpage :
187
Abstract :
This paper describes the continuing evolution of Honeywell´s HIRAP, Honeywell In-Service Reliability Assessment Program. The approaches used in HIRAP remain consistent with industry efforts in the area of reliability assessment. The paper also presents a description of the process flows, showing simplifications that have occurred in the process over the last year. Unlike conventional reliability prediction methodologies, which focus solely on part failure rates, the methodologies presented here incorporate design failure rates, manufacturing process failure rates and other causes for equipment removal
Keywords :
failure analysis; manufacturing processes; reliability; HIRAP; Honeywell In-Service Reliability Assessment Program; design failure rate; equipment removal causes; manufacturing process failure rate; methodology improvements; part failure rate; process flows; reliability assessment; reliability prediction; Airplanes; Application specific integrated circuits; Circuit testing; Defense industry; Failure analysis; Integrated circuit reliability; Life estimation; Maintenance; Manufacturing industries; Standards development;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 2000. Proceedings. Annual
Conference_Location :
Los Angeles, CA
ISSN :
0149-144X
Print_ISBN :
0-7803-5848-1
Type :
conf
DOI :
10.1109/RAMS.2000.816304
Filename :
816304
Link To Document :
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