Title :
Sketch and Validate for Big Data Clustering
Author :
Traganitis, Panagiotis A. ; Slavakis, Konstantinos ; Giannakis, Georgios B.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Minnesota, Minneapolis, MN, USA
Abstract :
In response to the need for learning tools tuned to big data analytics, the present paper introduces a framework for efficient clustering of huge sets of (possibly high-dimensional) data. Building on random sampling and consensus (RANSAC) ideas pursued earlier in a different (computer vision) context for robust regression, a suite of novel dimensionality- and set-reduction algorithms is developed. The advocated sketch-and-validate (SkeVa) family includes two algorithms that rely on K-means clustering per iteration on reduced number of dimensions and/or feature vectors: The first operates in a batch fashion, while the second sequential one offers computational efficiency and suitability with streaming modes of operation. For clustering even nonlinearly separable vectors, the SkeVa family offers also a member based on user-selected kernel functions. Further trading off performance for reduced complexity, a fourth member of the SkeVa family is based on a divergence criterion for selecting proper minimal subsets of feature variables and vectors, thus bypassing the need for K-means clustering per iteration. Extensive numerical tests on synthetic and real data sets highlight the potential of the proposed algorithms, and demonstrate their competitive performance relative to state-of-the-art random projection alternatives.
Keywords :
Big Data; data analysis; pattern clustering; K-means clustering; RANSAC; SkeVa family; big data analytics; big data clustering; dimensionality-reduction algorithms; divergence criterion; random sampling; reduced complexity; robust regression; set-reduction algorithms; sketch-and-validate family; user-selected kernel functions; Big data; Clustering algorithms; Complexity theory; Kernel; Signal processing algorithms; Special issues and sections; Vectors; $K$-means; Clustering; feature vector selection; high-dimensional data; sketching; validation; variable selection;
Journal_Title :
Selected Topics in Signal Processing, IEEE Journal of
DOI :
10.1109/JSTSP.2015.2396477