Title :
Highly Efficient and Linear Class E SiGe Power Amplifier Design
Author :
Lie, Donald Y C ; Popp, Jeremy D. ; Rowland, Jason F. ; Yang, Annie H. ; Wang, Feipeng ; Kimball, Don
Author_Institution :
Dynamic Res. Corp., San Diego, CA
Abstract :
This paper discusses the design of monolithic RF broadband Class E SiGe power amplifiers (PAs) that are highly efficient and linear. Load-pull measurement data on IBM 7HP SiGe power devices have been made at 900MHz and 2.4GHz and monolithic class E PAs have been designed using these devices to achieve highest power-added-efficiency (PAE) at these frequencies. It is found that high PAE can be achieved for monolithic single-stage Class E PAs designed using high-breakdown SiGe transistors at ~65% (900MHz) and ~40% (2.4GHz), respectively, which are roughly ~10% lower than the device´s maximum PAE values obtained by load-pull tests under optimal off-chip matching conditions. We have also demonstrated that monolithic SiGe class E PAs can be successfully linearized using an open-loop envelope tracking (ET) technique as their output spectra pass the stringent EDGE transmit mask with margins, achieving overall PAE of 44.4% for the linearized PA system that surpasses the < 30% PAE with commercially available GaAs Class AB PAs for EDGE applications. These promising results indicate the feasibility of realizing true single-chip wireless transceivers with on-chip RF SiGe PAs for spectrally-efficient non-constant-envelope modulation schemes
Keywords :
Ge-Si alloys; elemental semiconductors; monolithic integrated circuits; power amplifiers; 2.4 GHz; 900 MHz; EDGE applications; SiGe; high-breakdown transistors; linear class E SiGe power amplifier design; load-pull measurement; monolithic RF broadband class E SiGe power amplifiers; open-loop envelope tracking technique; power-added-efficiency; single-chip wireless transceivers; spectrally-efficient nonconstant-envelope modulation schemes; Broadband amplifiers; Frequency measurement; Gallium arsenide; Germanium silicon alloys; High power amplifiers; Power measurement; Radio frequency; Radiofrequency amplifiers; Silicon germanium; Testing;
Conference_Titel :
Solid-State and Integrated Circuit Technology, 2006. ICSICT '06. 8th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
1-4244-0160-7
Electronic_ISBN :
1-4244-0161-5
DOI :
10.1109/ICSICT.2006.306278