• DocumentCode
    3470782
  • Title

    Gate delay estimation based on close-ended line model

  • Author

    Gang, Dong ; Yintang, Yang ; Yuejin, Li

  • Author_Institution
    Microrelectronics Inst., Xidian Univ., Xi´´an
  • Volume
    2
  • fYear
    2005
  • fDate
    24-0 Oct. 2005
  • Firstpage
    1047
  • Lastpage
    1051
  • Abstract
    Delay estimation is always a crucial concern in the VLSI design and it becomes increasingly more critical in the nowadays deep-submicron technology. Accurate estimation of gate delay closely depends on the model for the driving point admittance of a load interconnect tree. In this paper, a close-ended line model for transmission line tree reduction is proposed. The model can be applied to delay estimation of gate driving large transmission line tree. It features simple construction and high precision
  • Keywords
    VLSI; delay estimation; integrated circuit design; VLSI design; close-ended line model; deep-submicron technology; gate delay estimation; transmission line tree reduction; Admittance; Capacitance; Delay estimation; Inductance; Integrated circuit interconnections; RLC circuits; Semiconductor device modeling; Transmission lines; Very large scale integration; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC, 2005. ASICON 2005. 6th International Conference On
  • Conference_Location
    Shanghai
  • Print_ISBN
    0-7803-9210-8
  • Type

    conf

  • DOI
    10.1109/ICASIC.2005.1611480
  • Filename
    1611480