Title :
Gate delay estimation based on close-ended line model
Author :
Gang, Dong ; Yintang, Yang ; Yuejin, Li
Author_Institution :
Microrelectronics Inst., Xidian Univ., Xi´´an
Abstract :
Delay estimation is always a crucial concern in the VLSI design and it becomes increasingly more critical in the nowadays deep-submicron technology. Accurate estimation of gate delay closely depends on the model for the driving point admittance of a load interconnect tree. In this paper, a close-ended line model for transmission line tree reduction is proposed. The model can be applied to delay estimation of gate driving large transmission line tree. It features simple construction and high precision
Keywords :
VLSI; delay estimation; integrated circuit design; VLSI design; close-ended line model; deep-submicron technology; gate delay estimation; transmission line tree reduction; Admittance; Capacitance; Delay estimation; Inductance; Integrated circuit interconnections; RLC circuits; Semiconductor device modeling; Transmission lines; Very large scale integration; Voltage;
Conference_Titel :
ASIC, 2005. ASICON 2005. 6th International Conference On
Conference_Location :
Shanghai
Print_ISBN :
0-7803-9210-8
DOI :
10.1109/ICASIC.2005.1611480