Chronic electrode-brain interface modeled with FEM

Author

Oweiss, K. ; Wise, M. ; Lopez, C. ; Wiler, J. ; Anderson, D.

Author_Institution

Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA

Volume

1

fYear

1999

fDate

1999

Abstract

The recording properties of silicon-substrate chronic neuroprobes tend to degrade over time. Passing current through the site sometimes restores the recording ability. A 3D current flow Finite Element Model (FEM) was constructed to simulate the current flow from the site during the rejuvenation process. The simulation suggests that the injected current path does not coincide with current flow from the cell to the recording site. This explains why lowering the probe impedance by current injection does not necessarily restore chronic recording ability

Keywords

biomedical electrodes; brain models; finite element analysis; probes; silicon; 3D current flow finite element model; Si; chronic electrode-brain interface model; chronic recording ability restoration; current flow simulation; recording properties degradation; silicon-substrate chronic neuroprobes; Auditory system; Biosensors; Cleaning; Electrodes; Finite element methods; Impedance; Probes; Proteins; Silicon; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

[Engineering in Medicine and Biology, 1999. 21st Annual Conference and the 1999 Annual Fall Meetring of the Biomedical Engineering Society] BMES/EMBS Conference, 1999. Proceedings of the First Joint

Conference_Location

Atlanta, GA

ISSN

1094-687X

Print_ISBN

0-7803-5674-8

Type

conf

DOI

10.1109/IEMBS.1999.802531

Filename

802531