• DocumentCode
    3471024
  • Title

    Measurement of solder paste component retention properties

  • Author

    Thomas, Stephan ; Srihari, K. ; McLenaghan, A. James ; Westby, G.R.

  • Author_Institution
    Dept. of Syst. Sci., State Univ. of New York, Binghamton, NY, USA
  • fYear
    1995
  • fDate
    2-4 Oct 1995
  • Firstpage
    351
  • Lastpage
    360
  • Abstract
    Systematically evaluated the IPC-SP-819 tack test method. The study identified the factors that influenced the measurement and estimated their effect on the tack strength. An alternate tack test method that uses a shear tester was identified. Tack life measurements were conducted for six different solder pastes using the IPC, the modified IPC, and the shear tack test methods. The test results were validated by subjecting the slugs placed on the solder paste specimen to a shock test and measuring the component movement. The test validation process confirmed that the IPC test results do not always correlate to the component retention properties of solder pastes. However, the shear tack tests exhibited strong correlation. This research should enhance the knowledge of process engineers and solder paste vendors on the component retention properties of solder pastes during surface mount PCB assembly
  • Keywords
    assembling; life testing; mechanical strength; printed circuit manufacture; production testing; surface mount technology; IPC-SP-819 tack test method; PCB assembly; component movement; component retention properties; shear tester; solder paste; surface mount technology; tack life measurements; tack strength; test validation process; Adhesives; Assembly; Circuit testing; Electric shock; Electronics packaging; Industrial engineering; Instruments; Knowledge engineering; Laboratories; Life testing; Motion measurement; Printed circuits; Surface-mount technology; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Manufacturing Technology Symposium, 1995. 'Manufacturing Technologies - Present and Future', Seventeenth IEEE/CPMT International
  • Conference_Location
    Austin, TX
  • Print_ISBN
    0-7803-2996-1
  • Type

    conf

  • DOI
    10.1109/IEMT.1995.526186
  • Filename
    526186