Title :
Reduction method of number of electromagnetic simulation times for estimating output voltage at hard open TSV in 3D IC
Author :
Haraguchi, Ei ; Hashizume, Masaki ; Manabe, K. ; Yotsuyanagi, Hiroyuki ; Tada, Tetsuya ; Lu, Shyue-Kung ; Roth, Zvi
Author_Institution :
Ins. of Tech. & Sci., Univ. of Tokushima, Tokushima, Japan
Abstract :
An estimation method of quiescent output voltage of a defective TSV is proposed at which a hard open defect occurs in a 3D IC. The method enables us to reduce the number of times of 3D electromagnetic simulation.
Keywords :
circuit simulation; three-dimensional integrated circuits; 3D IC; 3D electromagnetic simulation; defective TSV; estimation method; hard open TSV; hard open defect; quiescent output voltage; reduction method; Electromagnetics; Estimation; Simulation; Three-dimensional displays; Through-silicon vias; Vectors; 3D IC; TSV; open defect;
Conference_Titel :
CPMT Symposium Japan (ICSJ), 2013 IEEE 3rd
Conference_Location :
Kyoto
Print_ISBN :
978-1-4799-2718-0
DOI :
10.1109/ICSJ.2013.6756128
