Title :
Failure analysis of electric circuit board by high resolution magnetic field microscopy
Author :
Mima, Yuki ; Kimura, K. ; Inao, Takashi ; Oyabu, Noriaki ; Kimura, N.
Author_Institution :
Grad. Sch. of Sci., Kobe Univ., Kobe, Japan
Abstract :
In this paper, we demonstrate various electric current imaging using electromagnetic field reconstruction method, and show its capability of reducing stray magnetic field effect.
Keywords :
electric current; electromagnetic fields; failure analysis; image reconstruction; magnetic field effects; magnetic fields; networks (circuits); nondestructive testing; electric circuit board; electric current imaging; electromagnetic field reconstruction method; failure analysis; high resolution magnetic field microscopy; stray magnetic field effect; Current; Equations; Image reconstruction; Magnetic fields; Microscopy; Tunneling magnetoresistance; magnetic field imaging; nondestractive testing; reconstruction;
Conference_Titel :
CPMT Symposium Japan (ICSJ), 2013 IEEE 3rd
Conference_Location :
Kyoto
Print_ISBN :
978-1-4799-2718-0
DOI :
10.1109/ICSJ.2013.6756129
