• DocumentCode
    3471263
  • Title

    A mixed design flow for FPGA prototyping of design with scan circuits

  • Author

    Li, Lingfeng ; Fajar, Eko ; Kurimoto, Ken-ichi ; Goto, Satoshi

  • Author_Institution
    Graduate Sch. of IPS, Waseda Univ.
  • Volume
    2
  • fYear
    2005
  • fDate
    24-0 Oct. 2005
  • Firstpage
    1127
  • Lastpage
    1130
  • Abstract
    Scan circuits are utilized in our design to support some special functionality besides test requirements, and thus they need to be inserted before the stage of function verification. In this paper, we propose a mixed design flow for field programmable gate array (FPGA) prototyping of the design with scan circuits. This mixed design flow combines the application specific integrated circuit (ASIC) design flow with typical FPGA design flow to implement automatically scan insertion. Experimental results show that this design flow functions well even for a complicated design, and only 2.5 % of the development time is required when compared to manual process
  • Keywords
    application specific integrated circuits; field programmable gate arrays; logic design; ASIC design flow; FPGA prototyping; application specific integrated circuit; field programmable gate array; mixed design flow; scan circuits; Application specific integrated circuits; Circuit faults; Circuit testing; Design for testability; Field programmable gate arrays; Flip-flops; Hardware; Large scale integration; Libraries; Prototypes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC, 2005. ASICON 2005. 6th International Conference On
  • Conference_Location
    Shanghai
  • Print_ISBN
    0-7803-9210-8
  • Type

    conf

  • DOI
    10.1109/ICASIC.2005.1611505
  • Filename
    1611505