Title :
A mixed design flow for FPGA prototyping of design with scan circuits
Author :
Li, Lingfeng ; Fajar, Eko ; Kurimoto, Ken-ichi ; Goto, Satoshi
Author_Institution :
Graduate Sch. of IPS, Waseda Univ.
Abstract :
Scan circuits are utilized in our design to support some special functionality besides test requirements, and thus they need to be inserted before the stage of function verification. In this paper, we propose a mixed design flow for field programmable gate array (FPGA) prototyping of the design with scan circuits. This mixed design flow combines the application specific integrated circuit (ASIC) design flow with typical FPGA design flow to implement automatically scan insertion. Experimental results show that this design flow functions well even for a complicated design, and only 2.5 % of the development time is required when compared to manual process
Keywords :
application specific integrated circuits; field programmable gate arrays; logic design; ASIC design flow; FPGA prototyping; application specific integrated circuit; field programmable gate array; mixed design flow; scan circuits; Application specific integrated circuits; Circuit faults; Circuit testing; Design for testability; Field programmable gate arrays; Flip-flops; Hardware; Large scale integration; Libraries; Prototypes;
Conference_Titel :
ASIC, 2005. ASICON 2005. 6th International Conference On
Conference_Location :
Shanghai
Print_ISBN :
0-7803-9210-8
DOI :
10.1109/ICASIC.2005.1611505