DocumentCode :
3471263
Title :
A mixed design flow for FPGA prototyping of design with scan circuits
Author :
Li, Lingfeng ; Fajar, Eko ; Kurimoto, Ken-ichi ; Goto, Satoshi
Author_Institution :
Graduate Sch. of IPS, Waseda Univ.
Volume :
2
fYear :
2005
fDate :
24-0 Oct. 2005
Firstpage :
1127
Lastpage :
1130
Abstract :
Scan circuits are utilized in our design to support some special functionality besides test requirements, and thus they need to be inserted before the stage of function verification. In this paper, we propose a mixed design flow for field programmable gate array (FPGA) prototyping of the design with scan circuits. This mixed design flow combines the application specific integrated circuit (ASIC) design flow with typical FPGA design flow to implement automatically scan insertion. Experimental results show that this design flow functions well even for a complicated design, and only 2.5 % of the development time is required when compared to manual process
Keywords :
application specific integrated circuits; field programmable gate arrays; logic design; ASIC design flow; FPGA prototyping; application specific integrated circuit; field programmable gate array; mixed design flow; scan circuits; Application specific integrated circuits; Circuit faults; Circuit testing; Design for testability; Field programmable gate arrays; Flip-flops; Hardware; Large scale integration; Libraries; Prototypes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ASIC, 2005. ASICON 2005. 6th International Conference On
Conference_Location :
Shanghai
Print_ISBN :
0-7803-9210-8
Type :
conf
DOI :
10.1109/ICASIC.2005.1611505
Filename :
1611505
Link To Document :
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