Title :
Meta patterns: discovering rough classifiers
Author :
Sever, Hayri ; Raghavan, Vijay V.
Author_Institution :
Dept. of Comput. Eng., Baskent Univ., Ankara, Turkey
Abstract :
Organizational memory in today´s business world forms basis for organizational learning, which is the ability of an organization to gain insight and understanding from experience through experimentation, observation, analysis, and a willingness to examine both successes and failures. This basically requires considering different aspects of knowledge that may reside on top of a conventional information management system. Of them, representational and retrieval issues of meta patterns constitute to the main theme of this article. Particularly we are interested in a formal approach to handle rough concepts. A user can inquire persistent concepts by expressing his/her information needs either by a set of rules in horn form constituting a concept or by search terms and their relationships. In turn, a concept may be defined characteristically or distinctively. The user may focus on either common properties of a concept and thus accordingly provide its definition by rules or its distinctive properties using rough classification methods. In this article, we propose a preliminary framework based on minimal term sets with p-norms to extract meta patterns.
Keywords :
information retrieval; knowledge based systems; pattern classification; rough set theory; information management system; meta patterns; organizational learning; p-norm retrieval; rough classification methods; Data mining; Error correction; Failure analysis; Information management; Information retrieval; Information systems; Knowledge acquisition; Logic; Management information systems; Rough sets;
Conference_Titel :
Fuzzy Information, 2004. Processing NAFIPS '04. IEEE Annual Meeting of the
Print_ISBN :
0-7803-8376-1
DOI :
10.1109/NAFIPS.2004.1337387