Title :
Reduction of tombstone capacitor problem by Six Sigma technique: A case study of printed circuit cable assembly line
Author :
Kuptasthien, Natha ; Boonsompong, Teerapong
Author_Institution :
Dept. of Ind. Eng., Rajamangala Univ. of Technol. Thanyaburi, Thanyaburi, Thailand
Abstract :
This paper demonstrated the implementation of Six Sigma technique and DMAIC improvement methodology into a mass manufacturing of printed circuit cables. The result showed that by following the theoretical Six Sigma technique and DMAIC steps, the defects from major tombstone capacitor problem could be reduced from 1,154 DPPM to 314 DPPM and increased 1st yield output from 98.4% to 99.66%.
Keywords :
assembling; mass production; printed circuit manufacture; six sigma (quality); DMAIC improvement methodology; mass manufacturing; printed circuit cable assembly line; six sigma technique; tombstone capacitor problem; Assembly; Capacitors; Industries; Inspection; Printed circuits; Process control; Six sigma; DMAIC; Printed circuit cable assembly; Six Sigma; Tombstone capacitor problem;
Conference_Titel :
Quality and Reliability (ICQR), 2011 IEEE International Conference on
Conference_Location :
Bangkok
Print_ISBN :
978-1-4577-0626-4
DOI :
10.1109/ICQR.2011.6031599
