Title :
Circuit Design and Verification of On-Chip Femto-Ampere Current Mode Circuit Using 0.18μm CMOS Technology
Author :
Zhang, Lei ; Yu, Zhiping ; He, Xiangqing
Author_Institution :
Inst. of Microelectron., Tsinghua Univ., Beijing
Abstract :
Recently, femto-ampere current mode circuit (FCMC) implemented in modern CMOS technology is in high demand in areas like integrated bio-sensor research and production, ultra low current analysis and detection, gauging instrument design and manufacturing and etc. In this paper, on-chip circuit modules in FCMC including femto-ampere current mirror (FCM) and generator (FCG), femto-ampere current mode amplifier (FCMA) and its differential structure, as well as the on-chip femto-ampere current reference (FCR) have been presented and verified in SMIC 0.18mum CMOS process by using proposed deep subthreshold MOSFET (DSMOS) technique. Meanwhile, optimization of DSMOS dimensions has also been actualized to diminish low frequency noises and leakages
Keywords :
CMOS analogue integrated circuits; analogue circuits; current mirrors; current-mode circuits; low-power electronics; network synthesis; reference circuits; 0.18 micron; CMOS technology; SMIC process; circuit design; circuit verification; current generator; current mirror; current mode amplifier; current mode circuit; current reference; deep subthreshold MOSFET; differential structure; low frequency noise reduction; on-chip femto-ampere circuit; CMOS process; CMOS technology; Circuit synthesis; Current mode circuits; Differential amplifiers; Instruments; Integrated circuit manufacture; Integrated circuit technology; Mirrors; Production;
Conference_Titel :
Solid-State and Integrated Circuit Technology, 2006. ICSICT '06. 8th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
1-4244-0160-7
Electronic_ISBN :
1-4244-0161-5
DOI :
10.1109/ICSICT.2006.306331
