DocumentCode :
3471719
Title :
Nano-scale CMOS and Low Voltage Analog to Digital Converter Design Challenges
Author :
Matsuzawa, Akira
Author_Institution :
Dept. of Phys. Electron., Tokyo Inst. of Technol.
fYear :
2006
fDate :
23-26 Oct. 2006
Firstpage :
1676
Lastpage :
1679
Abstract :
This paper discusses the analog performance trend and the performance estimation of pipeline ADC in nano-scale CMOS era. The technology scaling is effective to increase the conversion rate, however it is not effective to increase the resolution, SNR, and decrease the power consumption at higher resolution. New converter design challenge is needed and one strong candidate must be the successive approximation ADC because it does not require operational amplifiers that consume power and become difficult to design with nano-scale CMOS
Keywords :
CMOS integrated circuits; analogue-digital conversion; nanoelectronics; analog-to-digital converter design; nanoscale CMOS; pipeline ADC; Analog circuits; Analog-digital conversion; CMOS technology; Cutoff frequency; Digital systems; Energy consumption; Frequency conversion; Low voltage; MOSFETs; Pipelines;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated Circuit Technology, 2006. ICSICT '06. 8th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
1-4244-0160-7
Electronic_ISBN :
1-4244-0161-5
Type :
conf
DOI :
10.1109/ICSICT.2006.306370
Filename :
4098509
Link To Document :
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