• DocumentCode
    3471789
  • Title

    Automated antenna detection and correction methodology in VLSI designs

  • Author

    Shukla, Vrashank ; Gupta, Vinod ; Guruprasad, C. ; Kadamati, Gopalarao

  • Author_Institution
    Texas Instruments India, Bangalore, India
  • fYear
    2003
  • fDate
    24-25 April 2003
  • Firstpage
    158
  • Lastpage
    161
  • Abstract
    As more and more devices are packed on a single chip and as the complexities of VLSI designs are increasing, antenna detection and correction is becoming an increasingly challenging task. The paper presents a methodology, which employs a combination of prevention and correction of antennae at various stages of ASIC (Application specific Integrated Circuits) design flow such as cell library development, block design flow and chip design flow. The methodology advocates adding protection diodes only in a certain number of cells in the library. We have implemented this methodology in our ASIC design flow and are able to solve antenna issues in designs with negligible impact on die size (24% increase in die-size in less than 5% of the designs) and performance (0.3%-0.6% worst case impact to delay). By employing this methodology, we found that the number of antennae in the final layout reduced to very small number and even to zero in some cases, and we were able to save the time involved in correcting antennae.
  • Keywords
    VLSI; application specific integrated circuits; integrated circuit layout; integrated circuit technology; plasma materials processing; protection; ASIC design flow; VLSI designs; antenna correction methodology; automated antenna detection; block design flow; cell library development; chip design flow; die size; final layout; plasma damage; protection diodes; Application specific integrated circuits; Chip scale packaging; Design methodology; Instruments; Libraries; Plasma devices; Plasma materials processing; Protection; Very large scale integration; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma- and Process-Induced Damage, 2003 8th International Symposium
  • Print_ISBN
    0-7803-7747-8
  • Type

    conf

  • DOI
    10.1109/PPID.2003.1200947
  • Filename
    1200947