• DocumentCode
    3472316
  • Title

    An approach of LED lamp system lifetime prediction

  • Author

    Li, X.P. ; Chen, Luo-nan ; Chen, Mei

  • Author_Institution
    Philips Lighting, Shanghai, China
  • fYear
    2011
  • fDate
    14-17 Sept. 2011
  • Firstpage
    110
  • Lastpage
    114
  • Abstract
    Different from the MTTF/MTBF widely used to describe the reliability of electronic products, lifetime is used for the LED lamp. The lifetime is defined as a time when 50% of lamp´s lumen output is less than 70% of initial value, either by lumen decay of LED light source or catastrophic failure of electronic component. In other words, the reliability of LED lamp consists of not only the MTTF/MTBF of electronic components, but also other failure modes in the whole lifetime, ie electronic component or lumen degradation. However, the currently available reliability standards for LED lamp only focus on lumen maintenance, while cannot give any method on how to measure the LED lamps´ lifetime. With reviewing the system structure and failure modes of LED lamp, the paper proposes a methodology for the reliability of LED lamp.
  • Keywords
    LED lamps; electronic products; failure analysis; power system reliability; LED lamp; MTBF; MTTF; electronic component; electronic product reliability; failure modes; lifetime prediction; light source; lumen degradation; lumen maintenance; Electric shock; LED lamps; Light sources; Maintenance engineering; Reliability; B50L70; LED Lamp; Lifetime; Lumen Maintenance; Thermal Shock;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality and Reliability (ICQR), 2011 IEEE International Conference on
  • Conference_Location
    Bangkok
  • Print_ISBN
    978-1-4577-0626-4
  • Type

    conf

  • DOI
    10.1109/ICQR.2011.6031691
  • Filename
    6031691