DocumentCode :
3472406
Title :
Software reliability growth process-a life cycle approach
Author :
Raheja, Dev G.
Author_Institution :
Technol. Manage. Inc., Laurel, MD, USA
fYear :
1989
fDate :
24-26 Jan 1989
Firstpage :
52
Lastpage :
55
Abstract :
The author presents a life-cycle cost-reduction technique to achieve rapid growth rate in software reliability growth. He points out the deficiencies in the current practices in the hardware reliability growth process and how to overcome such weaknesses in software engineering. It is suggested that fixing errors in software introduces a negative growth because the programmer may not know which paths are affected by the change. The best way to accelerate the software reliability and maintenance growth is to identify engineering changes in the early design phases. The ATAF program tends to minimize risks and lower life-cycle costs significantly
Keywords :
software reliability; ATAF program; cost-reduction technique; life cycle; rapid growth rate; software engineering; software reliability; Computer bugs; Costs; Failure analysis; Hardware; Performance analysis; Radar; Rain; Software reliability; Technology management; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 1989. Proceedings., Annual
Conference_Location :
Atlanta, GA
Type :
conf
DOI :
10.1109/ARMS.1989.49573
Filename :
49573
Link To Document :
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