Title :
Microtomography at the ESRF beamline ID 22
Author :
Weitkamp, T. ; Rau, C. ; Snigirev, A. ; Drakopoulos, M. ; Simionovici, A.
Author_Institution :
Eur. Synchrotron Radiat. Facility, Grenoble, France
Abstract :
Summary form only given. We present the microtomography setup at the ESRF microfluorescence, imaging and diffraction beamline ID 22, including recent results and technical developments. The coherence properties of the high-energy (10 to 70 keV) X-ray undulator beam at ID 22 make the setup especially suited for phase-contrast tomography including possible holographic reconstruction. A fast-readout, low-noise CCD camera makes time-resolved imaging possible. Recent developments in magnifying X-ray optics such as compound refractive lenses and Fresnel zone plates open up the field of magnified-X-ray imaging with a resolution of less than 300 nm. The combination of scanning microprobe techniques such as microfluorescence and microdiffraction with full-field imaging and tomography allows the acquisition of complementary data on morphology, chemistry and crystal structure of a sample. Imaging techniques using a “pink beam”, i.e., a beam with limited monochromaticity obtained by filtering one harmonic from the undulator spectrum, can increase flux in intensity-limited experiments
Keywords :
X-ray imaging; X-ray optics; coherence; lenses; synchrotron radiation; tomography; undulator radiation; wigglers; zone plates; 10 to 70 eV; ESRF beamline ID 22; Fresnel zone plates; coherence properties; compound refractive lenses; fast-readout low-noise CCD; full-field imaging; high-energy X-ray undulator beam; holographic reconstruction; limited monochromaticity beam; magnified-X-ray imaging; magnifying X-ray optics; microdiffraction; microfluorescence; microtomography setup; phase-contrast tomography; pink beam; scanning microprobe techniques; time-resolved imaging; Charge coupled devices; Charge-coupled image sensors; Holography; Image reconstruction; Optical imaging; Optical refraction; Tomography; Undulators; X-ray diffraction; X-ray imaging;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2000 IEEE
Conference_Location :
Lyon
Print_ISBN :
0-7803-6503-8
DOI :
10.1109/NSSMIC.2000.949263