DocumentCode :
3472555
Title :
Challenges for RF SOC in nanometer technology
Author :
Yen, Albert
Author_Institution :
UMC Corp., Sunnyvale, CA
fYear :
2006
fDate :
23-26 Oct. 2006
Firstpage :
1829
Lastpage :
1832
Abstract :
This paper discusses the challenges, and issues that RF SOC facing regarding architecture, manufacture and design. To meet the challenge, silicon foundries have to provide more beyond design kits and manufacture services. The close cooperative of advanced semiconductor technology, design service, and advances in electronic design automation (EDA) becomes the solution for the new era. It is shown that novel improvements to the foundry design kits and utilization of advanced electromagnetic and circuit simulation is the key to first-pass silicon success
Keywords :
circuit simulation; electronic design automation; semiconductor technology; system-on-chip; RF SOC; advanced semiconductor technology; circuit simulation; electromagnetic simulation; electronic design automation; nanometer technology; Circuits; Computer architecture; Cost function; Electronic design automation and methodology; Foundries; Packaging; Radio frequency; Semiconductor device manufacture; Silicon; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated Circuit Technology, 2006. ICSICT '06. 8th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
1-4244-0160-7
Electronic_ISBN :
1-4244-0161-5
Type :
conf
DOI :
10.1109/ICSICT.2006.306459
Filename :
4098555
Link To Document :
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