• DocumentCode
    3472568
  • Title

    Area bonding conductive epoxy adhesives for low cost grid array chip carriers

  • Author

    Bolger, Justin C. ; Czarnowski, John M.

  • Author_Institution
    Merix Corp., Needham, MA, USA
  • fYear
    1995
  • fDate
    2-4 Oct 1995
  • Firstpage
    422
  • Lastpage
    427
  • Abstract
    This paper describes a new type of Z axis epoxy film adhesive, called a_rea b_onding c_onductive (ABC) epoxies, to replace solder and solder balls for surface mounting grid array chip carriers. The ABC adhesives are made by a low cost screen printing process, starting from customer-supplied artwork, so that the conductive epoxy regions are located only at the desired bond pad locations. Reliability data, presented for plastic and LTCC packages attached to FR-4 boards with these adhesives, show better resistance to thermal cycling and thermal shock than soldered packages. This paper also describes a new low cost copper lidded pad array chip carrier, called a Cu-PAC. This uses an ABC epoxy for die and for substrate attach. The Cu-PACs have the potential for major cost savings, size reduction and improved heat removal compared to present molded plastic grid array packages
  • Keywords
    adhesion; conducting polymers; cooling; integrated circuit packaging; integrated circuit reliability; surface mount technology; thermal shock; Cu-PAC; FR-4 boards; LTCC packages; Z axis epoxy film adhesive; area bonding conductive epoxy; bond pad locations; copper lidded pad array chip carrier; cost savings; grid array chip carriers; heat removal; screen printing process; size reduction; surface mounting; thermal cycling; thermal shock; Art; Assembly; Bonding; Copper; Costs; Electric shock; Electronic packaging thermal management; Plastic packaging; Plastics; Printing; Substrates; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Manufacturing Technology Symposium, 1995. 'Manufacturing Technologies - Present and Future', Seventeenth IEEE/CPMT International
  • Conference_Location
    Austin, TX
  • Print_ISBN
    0-7803-2996-1
  • Type

    conf

  • DOI
    10.1109/IEMT.1995.526198
  • Filename
    526198