DocumentCode :
3472746
Title :
A 3D X-ray microtomographic system with CMOS image sensor
Author :
Lee, S.W. ; Kim, H.K. ; Cho, G. ; Shin, Y.H. ; Won, Y.Y.
Author_Institution :
Dept. of Nucl. Eng., Korea Adv. Inst. of Sci. & Technol., Seoul, South Korea
Volume :
3
fYear :
2000
fDate :
2000
Abstract :
High resolution and three dimensional X-ray imaging is becoming more and more popular nowadays. An X-ray microtomographic system with CMOS image sensor has been developed. We have developed a novel area X-ray detector with cost-effective CMOS image sensor. The sensing area of the detector is 55 mm×55 mm and the light from the phosphor screen is collected to the CMOS image sensor by a carefully designed optical system. 6 lenses are assembled to reduce the radiation damage effect and increase the resolution and sensitivity. Microfocus X-ray tube which can reach up to 5 μm of focal spot size and microprecision motor system which can move in x-y-z direction for both alignment and magnification and rotate the,object have been adopted. Conventional 3D cone-beam Feldkamp reconstruction algorithm was used and a human cancellous bone has been imaged with this system. Currently, the resolution of this system is about 40 μm but the application in microtomography seems very promising using this CMOS X-ray detector
Keywords :
CMOS image sensors; X-ray detection; biomedical equipment; bone; computerised tomography; diagnostic radiography; image reconstruction; medical image processing; 3D X-ray microtomographic system; CMOS X-ray detector; CMOS image sensor; area X-ray detector; cone-beam Feldkamp reconstruction algorithm; high resolution X-ray imaging; human cancellous bone; medical CT; microfocus X-ray tube; microprecision motor system; osteoporosis; phosphor screen; radiation damage effect; Assembly systems; CMOS image sensors; Image resolution; Lenses; Optical design; Optical sensors; Phosphors; Radiation detectors; X-ray detectors; X-ray imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2000 IEEE
Conference_Location :
Lyon
ISSN :
1082-3654
Print_ISBN :
0-7803-6503-8
Type :
conf
DOI :
10.1109/NSSMIC.2000.949276
Filename :
949276
Link To Document :
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