• DocumentCode
    3472925
  • Title

    Control of application specific interconnection on gate arrays using an active checkerboard test structure

  • Author

    Hess, Christopher ; Weiland, Larg H. ; Lau, Günter ; Simoncit, P.

  • fYear
    1996
  • fDate
    25-28 March 1996
  • Firstpage
    55
  • Lastpage
    60
  • Keywords
    Application software; Circuit faults; Circuit testing; Fault tolerance; Integrated circuit interconnections; Integrated circuit manufacture; Integrated circuit testing; Materials testing; Parameter extraction; Statistical analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronic Test Structures, 1996. ICMTS 1996. Proceedings. 1996 IEEE International Conference on
  • Conference_Location
    Trento, Italy
  • Print_ISBN
    0-7803-2783-7
  • Type

    conf

  • DOI
    10.1109/ICMTS.1996.585568
  • Filename
    585568
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3472925