Title :
Control of application specific interconnection on gate arrays using an active checkerboard test structure
Author :
Hess, Christopher ; Weiland, Larg H. ; Lau, Günter ; Simoncit, P.
Keywords :
Application software; Circuit faults; Circuit testing; Fault tolerance; Integrated circuit interconnections; Integrated circuit manufacture; Integrated circuit testing; Materials testing; Parameter extraction; Statistical analysis;
Conference_Titel :
Microelectronic Test Structures, 1996. ICMTS 1996. Proceedings. 1996 IEEE International Conference on
Conference_Location :
Trento, Italy
Print_ISBN :
0-7803-2783-7
DOI :
10.1109/ICMTS.1996.585568
