DocumentCode
3472936
Title
An active contours method based on intensity and reduced Gabor features for texture segmentation
Author
Lu, Huchuan ; Liu, Yunyun ; Sun, Zhipeng ; Chen, Yenwei
Author_Institution
Dept. of Electron. Eng. Dalian, Dalian Univ. of Technol., Dalian, China
fYear
2009
fDate
7-10 Nov. 2009
Firstpage
1369
Lastpage
1372
Abstract
In this paper, we propose a cooperative strategy for segmentation of texture images which integrates reduced Gabor features and image components. In contrast with the structure tensor method, our algorithm can extract more important features for segmentation. In this work, Gabor filters tuned to a set of orientations, scales and frequencies are used to extract texture local features, and the vector-valued active contour without edges model is employed to segment images. The main contribution of this work is the cooperation of image components and the reduced Gabor features which are extracted by principal components analysis (PCA) to represent image features. This cooperation improves the quality of the method, since the segmentation is faster and better. We demonstrate the effectiveness of our algorithm by comparing with the method proposed by Wang for segmenting synthetic and nature texture images.
Keywords
Gabor filters; feature extraction; image representation; image segmentation; image texture; principal component analysis; Gabor feature extraction; Gabor filters; edges model; image components; image feature representation; intensity feature; principal components analysis; structure tensor method; synthetic image segmentation; texture image segmentation; texture local feature extraction; vector-valued active contour method; Active contours; Data mining; Educational institutions; Feature extraction; Frequency; Gabor filters; Image segmentation; Nonlinear equations; Principal component analysis; Tensile stress; Gabor filter; Texture segmentation; active contour without edges; level set;
fLanguage
English
Publisher
ieee
Conference_Titel
Image Processing (ICIP), 2009 16th IEEE International Conference on
Conference_Location
Cairo
ISSN
1522-4880
Print_ISBN
978-1-4244-5653-6
Electronic_ISBN
1522-4880
Type
conf
DOI
10.1109/ICIP.2009.5413359
Filename
5413359
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