TranGen: a SAT-based ATPG for path-oriented transition faults

We present a SAT-based ATPG tool targeting on a path-oriented transition fault model. Under this fault model, a transition fault is detected through the longest sensitizable path. In the ATPG process, we utilize an efficient false-path pruning technique to identify the longest sensitizable path through each fault site. We demonstrate that our new SAT-based ATPG can be orders-of-magnitude faster than a commercial ATPG tool. To demonstrate the quality of the tests generated by our approach, we compare its resulting test set to three other test sets: a single-detection transition fault test set, a multiple-detection transition fault test set, and a traditional critical path test set added to the single-detection set. The superiority of our approach is demonstrated through various experiments based on statistical delay simulation and defect injection using benchmark circuits.