Title :
Binary and core residue arithmetic comparison
Author_Institution :
Boeing High Technology Center
Keywords :
Adders; Area measurement; Arithmetic; Costs; Dynamic range; Logic circuits; Propagation delay; Read only memory; Semiconductor device measurement; Very large scale integration;
Conference_Titel :
Signals, Systems and Computers, 1989. Twenty-Third Asilomar Conference on
Print_ISBN :
0-929029-30-1
DOI :
10.1109/ACSSC.1989.1201022
