• DocumentCode
    3473328
  • Title

    Lidar waveform modeling using a marked point process

  • Author

    Mallet, Clément ; Lafarge, Florent ; Bretar, Frédéric ; Soergel, Uwe ; Heipke, Christian

  • Author_Institution
    Lab. MATIS, Inst. Geographique Nat., St. Mande, France
  • fYear
    2009
  • fDate
    7-10 Nov. 2009
  • Firstpage
    1713
  • Lastpage
    1716
  • Abstract
    Lidar waveforms are 1D signal consisting of a train of echoes where each of them correspond to a scattering target of the Earth surface. Modeling these echoes with the appropriate parametric function is necessary to retrieve physical information about these objects and characterize their properties. This paper presents a marked point process based model to reconstruct a lidar signal in terms of a set of parametric functions. The model takes into account both a data term which measures the coherence between the models and the waveforms, and a regularizing term which introduces physical knowledge on the reconstructed signal. We search for the best configuration of functions by performing a Reversible Jump Markov Chain Monte Carlo sampler coupled with a simulated annealing. Results are finally presented on different kinds of signals in urban areas.
  • Keywords
    Markov processes; Monte Carlo methods; optical radar; radar signal processing; signal reconstruction; simulated annealing; 1D signal; Earth surface; LIDAR signal reconstruction; LIDAR waveform modeling; echoes train; marked point process; parametric functions; physical information; reversible jump Markov chain Monte Carlo sampler; scattering target; simulated annealing; Coherence; Earth; Information retrieval; Laser radar; Monte Carlo methods; Scattering; Signal processing; Simulated annealing; Surface reconstruction; Surface waves; 3D point cloud; Lidar; Marked point process; RJMCMC; Signal reconstruction; Source modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing (ICIP), 2009 16th IEEE International Conference on
  • Conference_Location
    Cairo
  • ISSN
    1522-4880
  • Print_ISBN
    978-1-4244-5653-6
  • Electronic_ISBN
    1522-4880
  • Type

    conf

  • DOI
    10.1109/ICIP.2009.5413380
  • Filename
    5413380