DocumentCode :
3473681
Title :
A robust test sequence for XOR trees
Author :
Tao, D.L. ; Hartmann, C.R.P. ; Lala, P.K.
Author_Institution :
SUNY at Stony Brook
Volume :
2
fYear :
1989
fDate :
1989
Firstpage :
994
Lastpage :
998
Keywords :
Application software; Circuit faults; Circuit testing; Digital arithmetic; Electrical fault detection; Fault detection; Information science; Logic testing; Robustness; Semiconductor device modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Signals, Systems and Computers, 1989. Twenty-Third Asilomar Conference on
Print_ISBN :
0-929029-30-1
Type :
conf
DOI :
10.1109/ACSSC.1989.1201047
Filename :
1201047
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3473681
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