Title :
Sequential diagnosability of t-diagnosable systems
Author :
Srimani, Pradip K. ; Bagchi, Anindo
Author_Institution :
Southern Illinois University
Keywords :
Algorithm design and analysis; Computer science; Costs; Fault detection; Fault diagnosis; Sequential analysis; Sequential diagnosis; Sufficient conditions; System testing;
Conference_Titel :
Signals, Systems and Computers, 1989. Twenty-Third Asilomar Conference on
Print_ISBN :
0-929029-30-1
DOI :
10.1109/ACSSC.1989.1201053