Title :
Design and Verification for VAC SOC in Mixed DFT Frame
Author :
Zhang, Jin-yi ; Zhou, Jun ; Xiong, Yan-Shuang ; Han, Tong-Hui
Author_Institution :
Microelectron. R&D Center, Shanghai Univ.
Abstract :
A totally new mixed DFT frame (MDF) is introduced in this thesis which adapts for VAC SOC. VAC SOC consists of IPs with different circuit structure. Through the test pattern simulation and fault coverage evaluation, MDF is proved to be an efficient DFT frame that can obtain extremely high fault coverage under limited testing cost, and moreover, MDF is very popular and practical
Keywords :
automatic test pattern generation; design for testability; fault simulation; system-on-chip; DFT frame; VAC SOC; design for testability; fault coverage evaluation; system-on-chip; test pattern simulation; Circuit faults; Circuit testing; Communication standards; Control systems; Costs; Design for testability; Logic circuits; Microelectronics; Power capacitors; Very large scale integration;
Conference_Titel :
Solid-State and Integrated Circuit Technology, 2006. ICSICT '06. 8th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
1-4244-0160-7
Electronic_ISBN :
1-4244-0161-5
DOI :
10.1109/ICSICT.2006.306588
