Title :
Open architecture tester - What is a key issue of OAT?
Author_Institution :
Renesas Technology Corp.
Abstract :
This paper summarizes an outline of OAT(0pen Architecture Tester), and a positioning of OAT in an LSI manufacturing process is clarified. A mass-production test can be prepared synchronizing with the next SoC generation development & production by the OAT introduction. The panel will be disrussed the key issues required in order to make this advantage of the OAT.
Keywords :
Computer architecture; Electronic mail; Hardware; Large scale integration; Management training; Manufacturing processes; Production; Publishing; Semiconductor device testing; Software performance;
Conference_Titel :
Design Automation Conference, 2004. Proceedings of the ASP-DAC 2004. Asia and South Pacific
Conference_Location :
Yohohama, Japan
Print_ISBN :
0-7803-8175-0
DOI :
10.1109/ASPDAC.2004.1337593
