DocumentCode
3474019
Title
"Signal integrity analysis in the open architecture"
Author
Petrich, D.M.
Author_Institution
Wavecrest Corporation
fYear
2004
fDate
27-30 Jan. 2004
Firstpage
342
Lastpage
342
Abstract
Wavecrest is proud to be a charter member of the Semiconductor Test Consortium. For the last 8 years Wavecrest has played a leadership roll in signal integrity analysis with various standards [4] groups. This expertise has head us to develop IP useful in the analysis of fast data signals.
Keywords
Bandwidth; Bit error rate; Data analysis; Hardware; Phase locked loops; Production; Sampling methods; Signal analysis; System testing; Timing jitter;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2004. Proceedings of the ASP-DAC 2004. Asia and South Pacific
Conference_Location
Yohohama, Japan
Print_ISBN
0-7803-8175-0
Type
conf
DOI
10.1109/ASPDAC.2004.1337596
Filename
1337596
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