DocumentCode :
347416
Title :
Portable ADSS surface contamination meter
Author :
Edwards, K.S. ; Pedrow, P.D. ; Olsen, R.G.
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Washington State Univ., Pullman, WA, USA
fYear :
1999
fDate :
1999
Firstpage :
158
Abstract :
All dielectric self-supporting (ADSS) fiber optic cable is known to have a limited installation lifetime in some environments when installed near high voltage transmission lines. Dry band arcing has been identified as a contributing factor in the short service life for some of these cables. It has been hypothesized that contamination on the jacket of the fiber optic cable will be an indicator of cable installations that will have a short service life. In this work a portable transducer for measuring contamination levels on the jacket of ADSS cable is being designed, constructed and calibrated in a high voltage environment. The transducer will be designed to operate in both wet and dry conditions. It will measure the electrical resistance per meter of contaminated in-service ADSS fiber optic cable. The transducer will be effective in the range 105 to 107 Ω/m. It will be computer controlled thus requiring little intervention by the operator. This research will include laboratory scale tests with ADSS cable and a 365 kV AC power supply
Keywords :
arcs (electric); computerised instrumentation; corona; dielectric materials; electric resistance measurement; optical cables; portable instruments; surface contamination; 365 kV; Dry band arcing; all dielectric self-supporting fiber optic cable; high voltage environment; high voltage transmission lines; installation lifetime; portable ADSS surface contamination meter; portable transducer; service life; Cable shielding; Dielectrics; Electrical resistance measurement; Optical fiber cables; Optical fibers; Pollution measurement; Power cables; Surface contamination; Transducers; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1999 Annual Report Conference on
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-5414-1
Type :
conf
DOI :
10.1109/CEIDP.1999.804615
Filename :
804615
Link To Document :
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