DocumentCode :
3474211
Title :
Experimental estimates of the absolute sensitivity of a small animal PET scanner with depth-of-interaction capability
Author :
Seidel, J. ; Vaquero, J.J. ; Lee, I.J. ; Green, M.V.
Author_Institution :
Nat. Inst. of Health, Bethesda, MD, USA
Volume :
3
fYear :
2000
fDate :
2000
Abstract :
The authors are constructing a depth-of-interaction (DOI) capable small animal PET scanner that will consist of 18 LGSO/GSO DOI modules arranged around a 11.8 cm diameter ring. These 18 modules will be grouped together electronically by 3´s forming 6 sectors. Two of these sectors; have been fabricated, placed opposite one another on the ring and operated in time coincidence with the data acquisition system to be used in the final device. Since a 2-sector partial ring provides the first opportunity to obtain experimental measurements of absolute central (18F) point source sensitivity (ACPS), an important design parameter for this system, the authors sought to measure this quantity as a function of energy window at the earliest stage of construction. Measured ACPS values extrapolated to the full, 6-sector ring decreased as window width decreased: from 1034 cps/Ci or 2.8% (no energy window) to 594 cps/Ci or 1.6% (250-650 keV energy window) to 375 cps/Ci or 1.0% (400-650 keV energy window). These early results suggest that the final system will possess an ACPS substantially higher than several recently described small animal PET scanners
Keywords :
biological techniques; positron emission tomography; 11.8 cm; 250 to 650 keV; 6-sector ring; 18F point source; F; absolute sensitivity; biological research instrumentation; depth-of-interaction capability; design parameter; energy window; small animal PET scanner; two-sector partial ring; Animals; Chemical elements; Costs; Data acquisition; Energy measurement; Optical coupling; Optical imaging; Optical sensors; Positron emission tomography; Signal processing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2000 IEEE
Conference_Location :
Lyon
ISSN :
1082-3654
Print_ISBN :
0-7803-6503-8
Type :
conf
DOI :
10.1109/NSSMIC.2000.949349
Filename :
949349
Link To Document :
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