DocumentCode :
3474392
Title :
Research progress on Physics-of-Failure based fatigue stress-damage model of solder joints in electronic packing
Author :
Shao, Jiang ; Zeng, Chenhui ; Wang, Yun
Author_Institution :
Aero Combined Environ. Lab., China Aero-Polytechnology Establ., Beijing, China
fYear :
2010
fDate :
12-14 Jan. 2010
Firstpage :
1
Lastpage :
6
Abstract :
Physics-of-failure (POF) prognostic model is a key technique of prognostics and health management (PHM) which plays critical roles for remaining life assessment of the products. The recent developments in POF based stress-damage model on thermal fatigue and vibration fatigue of solder joints were summarized. Numerous fatigue stress-damage models were proposed such as stress-fatigue model, strain-fatigue model, fatigue models based on fracture mechanics, energy model and fatigue model based on damage mechanics. At last, problems on research of fatigue stress-damage models were summarized, and some suggestions for future investigations were also made.
Keywords :
fracture mechanics; research and development; solders; thermal stress cracking; damage mechanics; electronic packing; energy model; fatigue stress-damage model; fracture mechanics; health management; physics-of-failure prognostic model; product life assessment; solder joints; strain-fatigue model; stress-fatigue model; thermal fatigue; vibration fatigue; Capacitive sensors; Composite materials; Electronics packaging; Fatigue; Joining materials; Plastics; Prognostics and health management; Soldering; Thermal stresses; Vibrations; Physics-of-Failure; electronic packaging; fatigue stress-damage models; solder joint;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Prognostics and Health Management Conference, 2010. PHM '10.
Conference_Location :
Macao
Print_ISBN :
978-1-4244-4756-5
Electronic_ISBN :
978-1-4244-4758-9
Type :
conf
DOI :
10.1109/PHM.2010.5413434
Filename :
5413434
Link To Document :
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