Title :
3-D and 1-D dynamics of slender liquid jets: linear analysis with electric field and accuracy of 1-D models near the breakup
Author :
Garcia, F.J. ; Castellanos, Antonio
Author_Institution :
Dept. de Electron. y Electromagnetismo, Facultad de Fisica, Sevilla, Spain
Abstract :
In a previous paper [Phys. Fluids, vol. 6, 2676 (1994)], the authors derived four 1-D models (Lee, Cosserat, averaged, and parabolic models) for slender axisymmetric liquid jets from the Navier-Stokes equations. The error of these 1-D models was calculated for small perturbations, in the absence of electric field. Here, we extend the linear error analysis to both perfectly insulating liquid jets in a tangential electric field and perfectly conducting liquid jets in a radial electric field. The accuracy of these models for studying the breakup, when nonlinear effects are no longer negligible, is also tested in the absence of electric field. A comparison of numerical 3-D solutions with results from 1-D models is made. A formulation of the energy conservation in 1-D models allows identifying and correcting a numerical instability of the averaged model near the breakup. It also explains why the Cosserat model overestimates the breakup time for moderate or large viscosity. Good agreement between 1-D and 3-D numerical results is found
Keywords :
Navier-Stokes equations; dielectric liquids; electric field effects; jets; viscosity; 1D dynamics; 3D dynamics; Cosserat model; Navier-Stokes equations; axisymmetric liquid jets; linear error analysis; perfectly conducting liquid jets; perfectly insulating liquid jets; radial electric field; slender liquid jets; tangential electric field; Boundary conditions; Dielectric liquids; Dielectrics and electrical insulation; Electromagnetic analysis; Electromagnetic modeling; Error analysis; Navier-Stokes equations; Surface tension; Testing; Viscosity;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1999 Annual Report Conference on
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-5414-1
DOI :
10.1109/CEIDP.1999.804659