Title :
Batchless factory concept for very short cycle time semiconductor manufacturing
Author :
Stanley, Timothy D.
Author_Institution :
Factory Modeling & Simulation, Motorola, Manuf. Technol. Dev., Austin, TX, USA
Abstract :
The focus of this paper is a processing concept that moves the thermal processing steps out of the semiconductor fabrication facility, dramatically simplifying the front end of line processing and facilitating single wafer processing to potentially achieve a very short manufacturing process cycle time. In the batchless factory concept wafers would be preprocessed before entering the semiconductor fab by growing gate oxide over the surface of the wafer followed by a blanket poly-silicon gate deposition. Then, through the use of trench or field shield isolation, complementary MOS transistors could be built, isolated and integrated without the need to grow isolation or gate oxides
Keywords :
CMOS integrated circuits; factory automation; heat treatment; integrated circuit manufacture; integrated circuit technology; isolation technology; batchless factory concept; blanket polysilicon gate deposition; complementary MOS transistors; field shield isolation; gate oxide; line processing; manufacturing process cycle time; semiconductor manufacturing; single wafer processing; thermal processing steps; trench isolation; Fabrication; Furnaces; Inductors; Integrated circuit manufacture; MOSFETs; Manufacturing processes; Microelectronics; Production facilities; Semiconductor device manufacture; Silicon; Thermal factors; Thermal loading;
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1995. 'Manufacturing Technologies - Present and Future', Seventeenth IEEE/CPMT International
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-2996-1
DOI :
10.1109/IEMT.1995.526208