Title :
A novel and simple pulsed dc bias test system for power amplifier
Author :
Zhang Jian ; Li Ling-yun ; Gu Jian-zhong ; He Wei ; Sun Xiao-Wei
Author_Institution :
Shanghai Inst. of Microsyst. & Inf. Technol., Chinese Acad. of Sci., Shanghai
Abstract :
A novel and simple pulse Dc bias test system has been established to emulate an isothermal environment for on-wafer characterization of MMIC power amplifiers. Testing results of a Ka band monolithic power amplifier with pulse dc bias show a power output capacity increase of 1.5-2dBm at the frequency of 33GHz
Keywords :
MMIC power amplifiers; integrated circuit testing; 33 GHz; Ka band; MMIC power amplifiers; pulsed DC bias test; Circuit testing; High power amplifiers; MOSFET circuits; Power MOSFET; Power amplifiers; Power measurement; Probes; Pulse amplifiers; Pulse measurements; System testing;
Conference_Titel :
Solid-State and Integrated Circuit Technology, 2006. ICSICT '06. 8th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
1-4244-0160-7
Electronic_ISBN :
1-4244-0161-5
DOI :
10.1109/ICSICT.2006.306663
