• DocumentCode
    347457
  • Title

    Assessment of optimum SF6-air, SF6-N2 , SF6-CO2 according to particle contamination sensitivity

  • Author

    Ward, Sayed A.

  • Author_Institution
    Dept. of Electr. Eng., Fac. of Eng., Cairo, Egypt
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    415
  • Abstract
    The design stress of sulphur hexafluoride Gas Insulated Switchgear (GIS) systems are limited by the harmful effects resulting from the almost inevitable presence of particulate contamination in GIS equipment. Mixing SF6 with other gas is a possible way of improving GIS performance under particle contamination condition. This paper studies the breakdown of SF6-gas mixture (SF6-air, SF6-N2 and SF6-CO 2) in the presence of contaminating particles under applied DC voltage. The effect of particle dimensions on the breakdown voltage and so on the particle contamination factor (PCF) is presented in this work. The breakdown voltage-pressure characteristics for SF6-gas mixture with different fractional concentration of SF 6 in mixture are carried out. Also, the particle contamination sensitivity is sought for different parameters and to obtain the optimum SF6-gas mixtures for the case study. From this study it is concluded that some SF6-gas mixture have breakdown gradients comparable to that of pure SF6 and are less sensitive to the presence of strong localized fields
  • Keywords
    SF6 insulation; air; carbon compounds; electric breakdown; gas insulated switchgear; gas mixtures; nitrogen; SF6-CO2; SF6-N2; SF6-air; applied DC voltage; breakdown; breakdown voltage; design stress; optimum SF6-gas mixtures; particle contamination factor; particle contamination sensitivity; particulate contamination; sulphur hexafluoride gas insulated switchgear; Concurrent computing; Contamination; Costs; Dielectric breakdown; Electric breakdown; Gases; Ionization; Nitrogen; Pollution measurement; Sulfur hexafluoride;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1999 Annual Report Conference on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    0-7803-5414-1
  • Type

    conf

  • DOI
    10.1109/CEIDP.1999.804676
  • Filename
    804676