Title :
System for resistance unit transfer from 10 kΩ UP TO 100 TΩ based on Hamon transfers
Author :
Lisowski, M. ; Krawczyk, K.
Author_Institution :
Inst. of Electr. Eng. & Technol. Fundamentals, Wroclaw Univ. of Technol., Wroclaw, Poland
Abstract :
Hamon transfers allow accurate comparison of resistance value of standards in 1:10 and 1:100 ratios. In the paper idea of construction design and development of the Hamon transfers, used for resistance unit transfer from the primary standard QHR (Quantum Hall Resistance) to high value resistance standards up to 100 TΩ, in which factors influencing transfers uncertainty were minimized, has been shown.
Keywords :
resistors; transfer standards; Hamon transfers; primary standard QHR; quantum hall resistance; resistance 10 kohm to 100 Tohm; resistance unit transfer system; transfer uncertainty; Circuits; Electric resistance; Electrical resistance measurement; Electromagnetic interference; Humidity; Insulation; Leakage current; Resistors; Temperature sensors; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2010 Conference on
Conference_Location :
Daejeon
Print_ISBN :
978-1-4244-6795-2
DOI :
10.1109/CPEM.2010.5544154
