DocumentCode :
3474857
Title :
Total dose induced bias current variation in the LM124 operational amplifier with Different Bias
Author :
Liu Jian-Bo ; Liu Yuan ; En Yun-Fei ; Yang Yuan-Zheng ; He Yu-Juan ; Shi Qian
Author_Institution :
Guangdong Univ. of Technol., Guangzhou, China
fYear :
2013
fDate :
3-5 June 2013
Firstpage :
1
Lastpage :
2
Abstract :
Total dose dependence of bias current in the linear operational amplifier LM124 with different bias are presented. The experimental results show that the bias currents in the LM124 with powered bias are significant affected by oxide trapped charges; furthermore, the bias currents in the low dose rate are more affected by the interface state near Si/SiO2. These results can be used for design and hardness assurance.
Keywords :
interface states; operational amplifiers; radiation hardening (electronics); LM124 operational amplifier; Si-SiO2; interface state; linear operational amplifier; low dose rate; oxide trapped charges; total dose induced bias current variation; bias current; fixed charge; interface state; operational amplifier; total dose;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices and Solid-State Circuits (EDSSC), 2013 IEEE International Conference of
Conference_Location :
Hong Kong
Type :
conf
DOI :
10.1109/EDSSC.2013.6628049
Filename :
6628049
Link To Document :
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