Title :
Timing measurement unit with multi-stage TVC for embedded memories
Author :
Kae-Jiun Mo ; Shao-Sheng Yang ; Tsin-Yuan Chang
Author_Institution :
National Tsing-Hua University
Abstract :
To find the maximum access time for embedded memories, a wide range and scalable time-to-digital converter (TDC) composed of multi-stage time-to-voltage converter (TVC), peak voltage detector, voltage-to-time converter (VTC) and ring counter is present. Four-stage TVC is applied in the TDC to measure the time intervals of 3ns to 160ns and 500ps resolution with external clock 50MHz. After calibration, the measured maximum error and linearity error are one LSB and 0.625%, respectively.
Keywords :
Clocks; Counting circuits; Detectors; Integrated circuit measurements; Measurement units; Semiconductor device measurement; Testing; Time measurement; Timing; Voltage;
Conference_Titel :
Design Automation Conference, 2004. Proceedings of the ASP-DAC 2004. Asia and South Pacific
Conference_Location :
Yohohama, Japan
Print_ISBN :
0-7803-8175-0
DOI :
10.1109/ASPDAC.2004.1337651
