Title : 
National metrology standards for scattering parameter calibration at radio frequency
         
        
            Author : 
Horibe, Masahiro ; Shida, Masaaki ; Komiyama, Koji
         
        
            Author_Institution : 
Nat. Metrol. Inst. of Japan, Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan
         
        
        
        
        
        
            Abstract : 
This paper summarizes a load device used as the NMIJ´s primary standards for S-parameter calibrations at radio frequencies. The characteristics of the primary load device were calculated on the basis of microwave transmission line theory after SI traceable measurements of dimensions and resistance / insertion loss of whole parts of the load device. The load device keeps its characteristics for a long time, i.e. approximately within 0.00035 deviation par four months. The expanded uncertainty of approximately 0.001 was achieved at 10 MHz for reflection coefficient of the load device.
         
        
            Keywords : 
S-parameters; calibration; transmission line theory; S-parameter calibrations; SI traceable measurements; frequency 10 MHz; insertion loss; microwave transmission line theory; national metrology standards; primary load device; radio frequency; reflection coefficient; scattering parameter calibration; Calibration; Electrical resistance measurement; Metrology; Microwave devices; Microwave measurements; Microwave theory and techniques; Radio frequency; Scattering parameters; Transmission line measurements; Transmission line theory;
         
        
        
        
            Conference_Titel : 
Precision Electromagnetic Measurements (CPEM), 2010 Conference on
         
        
            Conference_Location : 
Daejeon
         
        
            Print_ISBN : 
978-1-4244-6795-2
         
        
        
            DOI : 
10.1109/CPEM.2010.5544186