Title :
MonolithTM package-a novel FBGA using 3-D transfer laminate circuit process
Author :
Yamazaki, Toshio ; Suzuki, Kazuhisa ; Wakashima, Yoshiaki ; Suzuki, Naoya ; Fukutomi, Naoki
Author_Institution :
Hitachi Chem. Co. Ltd., Ibaraki, Japan
Abstract :
In this paper, we propose a novel fine pitch BGA (FBGA) called the “Monolith” package that uses the 3D transfer laminate circuit (3D TLC) process. This package uses a circuit board with cavity down structure, with no via holes and no through holes to keep the packaging cost down. However, for FBGA applications, the circuit board must have a structure that lowers the wire-bonding plane to the ball-bonding plane and 60 μm pitch level microcircuit technology. In the 3D TLC process, fine pitch wiring patterns are formed on a carrier foil that consists of a thin barrier layer and a copper foil. At the next step, circuit pattern transfer to the substrate is carried out by pressing the foil on glass fabric resin prepregs using a heat vacuum press. As pressure is applied, the cavity is formed due to the metal mold. At the final process, the carrier foil and the barrier layer are selectively etched out. In this paper, we report not only a study of the 3D TLC process, but also the optimum assembly process to prepare the frame shape and the results of reliability tests
Keywords :
assembling; ball grid arrays; etching; fine-pitch technology; foils; hot pressing; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; laminates; moulding; printed circuits; 3D TLC process; 3D transfer laminate circuit process; 60 micron; Cu; FBGA; FBGA applications; Monolith package; ball-bonding plane; barrier layer; carrier foil; cavity down structure; cavity formation; circuit board; circuit board structure; circuit pattern transfer; copper foil; fine pitch BGA; fine pitch wiring patterns; foil pressing; frame shape; glass fabric resin prepregs; heat vacuum press; metal mold; microcircuit technology; optimum assembly process; packaging cost; reliability tests; selective etch; through holes; via holes; wire-bonding plane; Copper; Costs; Fabrics; Glass; Laminates; Packaging; Pressing; Printed circuits; Resins; Wiring;
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1999. Twenty-Fourth IEEE/CPMT
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-5502-4
DOI :
10.1109/IEMT.1999.804789