Title :
Improvement of saturation characteristics of a frequency-demodulation CMOS image sensor
Author :
Jun Ohta ; Yamamoto, K. ; Yu Oya ; Kagawa, K. ; Tokuda, T. ; Nunoshita, M.
Author_Institution :
Nara Institute of Science and Technology (NAIST)
Abstract :
This paper demonstrates improvement of image quality in a frequency-demodulation CMOS image sensor. We have already demonstrated fundamental characteristics of a frequency-demodulation function but the sensor shows relatively poor saturation characteristics due to a crosstalk effect. By introducing sweeping out residual carriers in a photogate and discharging them into an overflow drain, a fabricated image sensor using a standard 0.6 μm CMOS technology exhibits better saturation characteristics. The output at the saturation region increases 30 times larger than the orignial one.
Keywords :
CMOS image sensors; CMOS technology; Crosstalk; Frequency; Gray-scale; Image sensors; Intensity modulation; Optical modulation; Phase modulation; Sensor phenomena and characterization;
Conference_Titel :
Design Automation Conference, 2004. Proceedings of the ASP-DAC 2004. Asia and South Pacific
Conference_Location :
Yohohama, Japan
Print_ISBN :
0-7803-8175-0
DOI :
10.1109/ASPDAC.2004.1337656